Spektroskopi Sistemleri

Edmund Optics Spektroskopi Ürünleri

Edmund Optics Spektroskopi Ürünleri

EDMUND OPTICS SPEKTROSKOPİ ÜRÜNLERİ

TE-Cooled 350 – 1050nm Fluorescence Spectrometers

Laboratory Spectrometer

Smart CCD Based Spectrometers

UV Enhanced Smart CCD Spectrometers

Educational Spectroscope

Manual Mini-Chrom Monochromators

TE-Cooled 350 – 1050nm Fluorescence Spectrometers Laboratory Spectrometer Smart CCD Based Spectrometers UV Enhanced Smart CCD Spectrometers Educational Spectroscope Manual Mini-Chrom Monochromators
  • Thermoelectric (TE) Cooled for Low Dark Noise and High Stability
  • Compact, High Throughput, and High Resolution
  • Wide Spectral Response Range from UV to NIR
  • Includes Spectral Data Acquisition and Analysis Software
  • Cost-Effective Performance from 380 – 750nm
  • Lightweight, Compact Design
  • USB Cable and Software Included
  • Spectrometer Accessories Also Available
  • Onboard Data Processing and Temperature Compensation
  • 14ns Trigger Delay with +/- 1ns Gate Jitter in Multichannel Operation
  • USB 3.0 Communication Transferring over 930 Spectra/ Second in Burst Mode
  • Spectrometer Accessories Also Available
  • High Spectral Resolution of 0.6nm
  • Low Stray Light for Maximum Throughput
  • Plug and Play USB 3.0 Interface Transfers up to 900 Spectra per Second
  • Measure Wavelengths of Various Light Sources
  • Detect Elements by Flame Emmission
  • Ideal for Educational Classroom Use
  • 6 Choices of Wavelength Ranges
  • Compact, Handheld Size
  • 2 NIR Versions

Broadband Fiber-Coupled Light Sources

pre-Mix White Reflectance Coating

Spectralon® White, Grayscale, and Color Diffuse Reflectance Standards

General Purpose Integrating Spheres

Optopolymer® Diffuse Reflecting Film

 
Broadband Fiber-Coupled Light Sources Pre-Mix White Reflectance Coating #56-078 - Set of 4 Reflectance Standards (99%, 75%, 50%, and 2%) General Purpose Integrating Spheres Optopolymer® Diffuse Reflecting Film  
  • Designed for Use with Spectrometers
  • Lamps Available for UV to NIR
  • Xenon, Tungsten, or Deuterium Sources
  • Reflectance Value >97%
  • Usable from UV Through Near-IR
  • Suitable for Coating Metal and a Variety of Other Materials
  • Suitable for Spectroscopy, Colorimetry, Radiometry, and Machine Vision Applications
  • Diffuse Reflectance Independent of Viewing Angle
  • Durable, Stable, and Washable
  • Serialized Version with NIST Traceable Calibration Certificate and Data Available
  • Ideal for Measuring Light Sources
  • Can be Upgraded to Calibrate Sensors and Test Lenses
  • Designed for Simple System Integration
  • Optical PTFE Material with Lambertian Reflection
  • High Reflectance from 250 - 2500nm
  • High UV Stability and Chemical Resistance